Patrick A. Fitch is a partner at Warren Lex LLP.

Pat’s practice focuses on high-stakes intellectual property litigation, licensing, and strategic counseling. Pat represents clients in patent and trade secret litigation, and advises buyers and sellers in high-value and consortium IP transactions. Pat’s litigation experience spans U.S. state and federal trial courts, appellate courts, and U.S. International Trade Commission Section 337 unfair import investigations. Pat also coordinates global strategies for cross-border litigation and IP licensing campaigns, particularly involving the courts of China and the EU.

Pat’s in-house experience gives him a full understanding of the challenges in-house counsel face when guiding internal clients through significant legal matters. Pat most recently served as head of litigation for North America at Chinese technology conglomerate LeEco. Before that, Pat monetized one of the world’s largest IP portfolios as Director of Patent Litigation at Intellectual Ventures.

Before going in-house, Pat began his career at Alston & Bird, and was part of the team that opened the Washington, D.C. office of Quinn Emanuel Urquhart & Sullivan. Pat has represented complainants, respondents, and third parties in more than forty Section 337 investigations before the International Trade Commission, including enforcement proceedings and Federal Circuit appeals. Although Pat’s representations spanned technologies as diverse as integrated circuits and components, opaque polymers, RFID, and black powder rifles, he also managed to work on every front of the global smartphone patent wars for Samsung, Motorola, HTC, Eastman Kodak, Nokia, and others.